Focused Ion Beam (FIB)/Scanning Electron Microscopy (SEM) is considered to be one of the most powerful techniques for three-dimensional morphological analysis and chemical composition characterization. It is widely used to study materials for energy applications and, coupled with computational analysis, it enables detailed 3D reconstructions of the examined sample. LiFePO4 (LFP) is an interesting cathode …
Tag: FIB
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